DCM-10 In-line refractometer

The  KxS DCM-10 is a cutting-edge optical refractometer engineered for real-time, in-line concentration monitoring of wet chemicals across nearly all wafer processing steps. From incoming chemical verification to wafer cleaning, chemical etching, and chemical mechanical planarization (CMP), the DCM-10 delivers unmatched precision and reliability.

Designed specifically for the demanding environments of semiconductor manufacturing, the DCM-10 ensures consistent chemical concentrations to optimize process performance, enhance yield, and reduce waste. Its compact footprint, true full-bore design, and dual-body construction make it ideal for seamless integration into fab tools and benches without compromising flow dynamics or measurement integrity.